Equipment available at IMM and used in the group's research:
Structural Characterization
| IMM: Philips MRD X-ray diffractometer High and low resoluction configurations. |
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SEM (Hitachi S-800, LEO 1455) and AFM (Nanotec)
Magnetic Characterization
Polar and Transverse Kerr loopers.
Magneto Optical Torque set-up for anisotropy characterization.
MFM (Nanotec).
Optical, Magneto Optical and Magnetoplasmonic Characterization
Polar Kerr looper and spectrometer.Magnetic field up to 1.6T.
Transverse Kerr looper (Magnetic field up to 1.5T) and spectrometer.
Magnetoplasmon characterization using Kretschmann configuration.
Spectral Ellipsometer (Woollam M-2000FI).
SNOM (Nanonics 4000).
